Paolo MENGUCCI

Pubblicazioni

Paolo MENGUCCI

 

248 pubblicazioni classificate nel seguente modo:

Nr. doc. Classificazioni
168 1 Contributo su Rivista
74 4 Contributo in Atti di Convegno (Proceeding)
4 2 Contributo in Volume
2 6 Brevetti
Anno
Risorse
2006
Thermal stability of hydrogenated Mg/Al thin films
AIP Conference Proceedings
Autore/i: N., Patel; R., Checchetto; A., Miotello; Mengucci, Paolo
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/54067 Collegamento a IRIS

2006
Hydrogen kinetics in magnesium hydride: on different catalytic effects of niobium
APPLIED PHYSICS LETTERS
Autore/i: Bazzanella, N; Checchetto, R; Miotello, A; Sada, C; Mazzoldi, P; Mengucci, Paolo
Classificazione: 1 Contributo su Rivista
Abstract: The hydrogen desorption kinetics from pure and Nb-doped MgH2 samples was studied as function on the Nb concentration (6x10-4Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33067 Collegamento a IRIS

2005
Reactive pulsed laser deposition of thin molybdenum- and tungsten-nitride films
THIN SOLID FILMS
Autore/i: Bereznai, M; Majni, Giuseppe; Caricato, A; Fernadez, M; Luches, A; Mengucci, Paolo; Nagy, Pm; Juhasz, A; Nanai, L.
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/51146 Collegamento a IRIS

2005
Surface quality inspection of PbWO4 crystals by grazing incidence X-ray diffraction
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT
Autore/i: Mengucci, Paolo; A., DI CRISTOFORO; M., Lebeau; Majni, Giuseppe; Paone, Nicola; P., Pietroni; Rinaldi, Daniele
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/50436 Collegamento a IRIS

2005
Nb clusters formation in Nb-doped magnesium hydride
APPLIED PHYSICS LETTERS
Autore/i: R., Checchetto; N., Bazzanella; A., Miotello; C., Maurizio; F., Dacapito; Mengucci, Paolo; Barucca, Gianni; Majni, Giuseppe
Classificazione: 1 Contributo su Rivista
Abstract: Nb K-edge Extended X-ray Absorption Fine Structure spectroscopy (EXAFS), X-ray diffraction (XRD) and Transmission Electron Microscopy (TEM) were used to analyse the Nb coordination and phase formation in Nb-doped (5 at. %) h-Mg film samples deposited by r.f. magnetron sputtering. Results show that the catalytic effect of the Nb doping in the H2 absorption and desorption kinetics is connected with the formation of Nb nano-clusters dispersed in the host matrix. The H2 desorption from b-MgH2 is favoured by the elastic stress produced by b-NbH0.89 clusters on the MgH2 matrix that reduces the stability of the hydride phase and by preferential paths in the nanocomposite hydride.
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/50846 Collegamento a IRIS

2005
DEUTERIUM STORAGE IN Mg-Nb FILMS
JOURNAL OF ALLOYS AND COMPOUNDS
Autore/i: Checchetto, R; Bazzanella, N; Miotello, A; Mengucci, Paolo
Editore: Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33009 Collegamento a IRIS

2005
Excimer pulsed laser deposition and annealing of YSZ nanometric films on Si substrates
APPLIED SURFACE SCIENCE
Autore/i: Caricato, A. P.; Barucca, Gianni; DI CRISTOFORO, A; Leggieri, G; Luches, A; Majni, Giuseppe; Martino, M; Mengucci, Paolo
Classificazione: 1 Contributo su Rivista
Abstract: We report experimental results obtained for electrical and structural characteristics of yttria-stabilised zirconia (YSZ) thin films deposited by pulsed laser deposition (PLD) on Si substrates at room temperature. Some samples were submitted to thermal treatments in different ambient atmospheres (vacuum, N2 and O2) at a moderate temperature. The effects of thermal treatments on the film electrical properties were studied by C–Vand I–V measurements. Structural characteristics were obtained by X-ray diffraction (XRD), X-ray reflectivity (XRR) and transmission electron microscopy (TEM) analyses. The as-deposited film was amorphous with an in-depth non-uniform density. The annealed films became polycrystalline with a more uniform density. The sample annealed in O2 was uniform over all the thickness. Electrical characterisation showed large hysteresis, high leakage current and positive charges trapped in the oxide in the as-deposited film. Post-deposition annealing, especially in O2 atmosphere, improved considerably the electrical properties of the films.
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/53186 Collegamento a IRIS

2005
Effects of annealing on the microstructure of yttria-stabilised zirconia thin films deposited by laser ablation.
THIN SOLID FILMS
Autore/i: Mengucci, Paolo; Barucca, Gianni; Caricato, A. P.; DI CRISTOFORO, A.; Leggieri, G.; Majni, Giuseppe; Luches, A.
Classificazione: 1 Contributo su Rivista
Abstract: In this paper the microstructural characterisation of yttria-stabilised zirconia (YSZ) thin films deposited by laser ablation is reported for the as-deposited sample as well as for samples submitted to thermal treatments in different atmospheres (vacuum, N2 and O2) at a moderate temperature (500 8C). Results obtained by different characterisation techniques such as grazing incidence X-ray diffraction, X-ray reflectivity and transmission electron microscopy evidenced the formation of the cubic YSZ phase after the annealing treatments. On the contrary, the asdeposited sample is amorphous with nanocrystals of the cubic YSZ phase dispersed inside. It also exhibits a difference between the density of the surface region and the region of the interface with the substrate. This latter effect has been attributed to the loss of oxygen atoms during the deposition. The annealing treatments are able to recover the density unhomogeneity present inside the as-deposited sample, the degree of recovering depends on the ambient atmosphere.
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/50071 Collegamento a IRIS

2005
Effect of laser ablation parameters on the structure and properties of multicomponent magnetic films
Proceedings of SPIE
Autore/i: A., Luches; S., Luby; S., Acquaviva; A. P., Caricato; M., Fernandez; E., Majkova; Z., Frait; D., Fraitova; R., Malych; Mengucci, Paolo
Editore: SPIE
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/54065 Collegamento a IRIS

2004
PULSED LASER DEPOSITION OF MAGNETIC FILMS BY ABLATION OF Co- AND Fe-BASED AMORPHOUS ALLOYS
APPLIED PHYSICS. A, MATERIALS SCIENCE & PROCESSING
Autore/i: Caricato, A. P.; Fernandez, M; Frait, F; Fraitova, D; Luby, S; Luches, A; Majkova, E; Majni, Giuseppe; Mengucci, Paolo
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/51202 Collegamento a IRIS

2004
Formation and morphology of hardening nanostructures in an AlZnMg alloy
MATERIALS FORUM
Autore/i: Riontino, G; Dupasquier, A; Ferragut, R; Iglesias, M. M.; Macchi, C. E.; Massazza, M; Mengucci, Paolo; Somoza, A.
Editore: Rushcutters Bay, N.S.W.: Pergamon Press.
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33014 Collegamento a IRIS

2004
MAGNETIZATION REVERSAL IN EXCHANGE-COUPLED FeTaN/FeSm/FeTaN MULTYLAYERS
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
Autore/i: Vavassori, P; Gubbiotti, G; Carlotti, G; Madami, M; DI CRISTOFORO, A; Mengucci, Paolo; Weston, J; Zangari, G.
Editore: Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33073 Collegamento a IRIS

2004
Structural and magnetic properties of exchange-spring FeTaN/FeSm/FeTaN multilayers
SURFACE SCIENCE
Autore/i: G., Gubbiotti; P., Vavassori; G., Carlotti; M., Madami; Barucca, Gianni; Mengucci, Paolo; J., Weston; G., Zangari
Classificazione: 1 Contributo su Rivista
Abstract: The structural and magnetic properties of FeTaN/FeSm/FeTaN multilayers, deposited by dc magnetron sputtering, have been investigated as function of the alloy layers thickness. Structural and morphological characterizations, accomplished by transmission electron microscopy, X-ray reflectivity and grazing-incidence X-ray diffraction, account for a well-defined layered structure of the multilayers with a limited interface roughness. The magnetization reversal process is examined experimentally using magneto-optical Kerr vector magnetometry by measuring the longitudinal and transverse hysteresis loops. It is found that, for soft layer thickness above 3.2 nm, the magnetization reversal occurs via the formation of a stable exchange-spring state in which the magnetic moments of the outermost soft layer gradually rotates away from the unswitched underlying hard layer.
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/51204 Collegamento a IRIS

2004
Growth and characterization of highly epitaxial YBa2Cu3O7/La0.7Ca0.3MnO3 bilayer structures
PHYSICA. C, SUPERCONDUCTIVITY
Autore/i: DE SANTIS, A; Bobba, F; Boffa, M. A.; Caciuffo, ROBERTO GIOVANNI MARIA; Mengucci, Paolo; Salvato, M; Vecchione, A; Cucolo, A. M.
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/53233 Collegamento a IRIS

2004
DEUTERIUM STORAGE IN NANOCRYSTALLINE MAGNESIUM THIN FILMS
JOURNAL OF APPLIED PHYSICS
Autore/i: R, Checchetto; N, Bazzanella; A, Miotello; Brusa, R. S.; A., Zecca; Mengucci, P.
Editore: American Institute of Physics:2 Huntington Quadrangle, Suite 1NO1:Melville, NY 11747:(800)344-6902, (631)576-2287, EMAIL: subs@aip.org, INTERNET: http://www.aip.org, Fax: (516)349-9704
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/32793 Collegamento a IRIS

2004
STRUCTURAL EVOLUTION OF NANOCRYSTALLINE Pd-Mg BILAYERS UNDER DEUTERIUM ABSORPTION AND DESORPTION CYCLES
THIN SOLID FILMS
Autore/i: Checchetto, R; Brusa, R. S.; Bazzanella, N; Karwasz, G. P.; Spagolla, M; Miotello, A; Mengucci, Paolo; DI CRISTOFORO, A.
Editore: Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33006 Collegamento a IRIS

2004
Early Solute Clustering in an AlZnMg Alloy
Positron Annihilation: Proceedings of the 13th International Conference on Positron Annihilation
Autore/i: A, Dupasquier; R, Ferragut; Iglesias, M. M.; Macchi, C. E.; M, Massazza; G, Riontino; A., Somoza; Mengucci, P.
Editore: Trans Tech Publications
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33012 Collegamento a IRIS

2004
Formation and morphology of hardening nanostructures in an AlZnMg alloy
ICCA 9 - Proccedings of the 9th International Conference on Aluminium alloys
Autore/i: Riontino, G; Dupasquier, A; Ferragut, R; Iglesias, M. M.; Massazza, M; Mengucci, Paolo; Somoza, A.
Editore: J.F. Nie, A.J. Morton, B.C. Muddle
Luogo di pubblicazione: BRISBANE
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/42691 Collegamento a IRIS

2003
PULSED EXCIMER LASER ABLATION DEPOSITION OF YSZ AND TiN/YSZ THIN FILMS ON Si SUBSTRATES
APPLIED SURFACE SCIENCE
Autore/i: Caricato, A. P.; DI CRISTOFORO, A.; Fernandez, M.; Leggieri, G.; Luches, A.; Majni, Giuseppe; Mengucci, Paolo
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/51749 Collegamento a IRIS

2003
STRUCTURAL EVOLUTION OF Fe-Al MULTILAYERS SUBMITTED TO THERMAL ANNEALING
THIN SOLID FILMS
Autore/i: Mengucci, Paolo; Majni, Giuseppe; DI CRISTOFORO, A; Checchetto, R; Miotello, A; Tosello, C.
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/51750 Collegamento a IRIS

2003
Intermixing at interfaces of KrF laser irradiated Co/W multilayers
APPLIED SURFACE SCIENCE
Autore/i: Majkova, E; Majni, Giuseppe; Jergel, M; Chushkin, Y; D'Anna, E; Luches, A; Martino, M; Mengucci, Paolo; Kuwasawa, Y; Okayasu, S.
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/50429 Collegamento a IRIS

2003
DEPENDENCE OF THE PERPENDICULAR ANISOTROPY IN Co/Au MULTILAYERS ON THE NUMBER OF REPETITIONS
JOURNAL OF APPLIED PHYSICS
Autore/i: Mengucci, Paolo; Gubbiotti, G.; Carlotti, G.; Albertini, F.; Casoli, F.; Bontempi, E.; Depero, L. E.; DI CRISTOFORO, A.; Koo, H.; Gomez, R. D.
Editore: American Institute of Physics:2 Huntington Quadrangle, Suite 1NO1:Melville, NY 11747:(800)344-6902, (631)576-2287, EMAIL: subs@aip.org, INTERNET: http://www.aip.org, Fax: (516)349-9704
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/32989 Collegamento a IRIS

2003
Electronic Phase separation in La0.85Sr0.15CoO3.
Proceedings of 6th Multinational Congress on Microscopy.
Autore/i: Barucca, Gianni; Mengucci, Paolo
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/46584 Collegamento a IRIS

2003
Pulsed laser deposition of thin refractory metal nitride films
Advanced laser technologies
Autore/i: M., Fernandez; M., Bereznai; A. P., Caricato; E., D'Anna; A., Juhasz; G., Leggieri; A., Luches; G., Majni; M., Martino; Mengucci, Paolo; P. M., Nagy; L., Nanai; Z., Toth
Editore: SPIE
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/54068 Collegamento a IRIS

2003
PULSED LASER DEPOSITION OF Co- AND Fe-BASED AMORPHOUS MAGNETIC FILMS AND MULTILAYERS
THIN SOLID FILMS
Autore/i: S., Acquaviva; A. P., Caricato; E., D'Anna; M., Fernandez; A., Luches; Z., Frait; E., Majkova; M., Ozvold; S., Luby; Mengucci, P.
Editore: Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/32990 Collegamento a IRIS

2003
Thin Films of YSZ Deposited by Laser Ablation.
Proceedings of 6th Multinational Congress on Microscopy.
Autore/i: Mengucci, Paolo; A., DI CRISTOFORO; Barucca, Gianni; A. P., Caricato; M., Martino; G., Leggieri
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/46585 Collegamento a IRIS

2002
Excimer laser reactive deposition of vanadium nitride thin films
APPLIED SURFACE SCIENCE
Autore/i: D'Anna, E.; DI CRISTOFORO, A.; Fernandez, M.; Leggieri, G.; Luches, A.; Majni, Giuseppe; Mengucci, Paolo; Nanai, L.
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/50279 Collegamento a IRIS

2002
Reactive pulsed laser ablation deposition of nitride thin films
Recent research developments in applied physics
Autore/i: G., Leggieri; A. P., Caricato; M., Fernandez; M., Martino; Mengucci, Paolo; Barucca, Gianni
Editore: Transworld research network
Luogo di pubblicazione: KERALA
Classificazione: 2 Contributo in Volume
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/41262 Collegamento a IRIS

2002
Coherent carbon nitride phases grown on Si substrates by reactive laser ablation
Recent research developments in applied physics
Autore/i: Mengucci, Paolo; Barucca, Gianni; G., Majni; A., DI CRISTOFORO; G., Legieri; M., Martino
Editore: Transworld Research Network
Luogo di pubblicazione: KERALA
Classificazione: 2 Contributo in Volume
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/50474 Collegamento a IRIS

2002
Laser irradiation induced diffusion in metallic multilayers
Advanced Laser Technologies
Autore/i: Luby, S.; Majkova, E.; Jergel, M.; D’Anna, E.; Luches, A.; Martino, M.; Mengucci, Paolo; Majni, Giuseppe
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/239125 Collegamento a IRIS

2002
EARLY DECOMPOSITION STAGES IN TWO Al-Cu-Mg ALLOYS
Aluminium Alloys 2002 Their Physical and Mechnaical Properties: Proceedings of the 8th International Conference ICAA8
Autore/i: Riontino, G.; Massazza, M.; Negri, D.; Mengucci, Paolo
Editore: Trans Tech Publications Limited:Brandrain 6, CH 8037 Uetikon Switzerland:011 41 1 9221022, EMAIL: ttp@ttp.net, INTERNET: http://www.ttp.net, Fax: 011 41 1 9221033
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33011 Collegamento a IRIS

2002
Deuterium thermal desorption from FeAl thin films
JOURNAL OF PHYSICS. D, APPLIED PHYSICS
Autore/i: Checchetto, R; Miotello, A; Tosello, C; Principi, G; Mengucci, Paolo
Editore: [Bristol]: IOP Publishing.
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/32987 Collegamento a IRIS

2002
Intermixing at interfaces of Fe/W multilayers
MATERIALS SCIENCE AND ENGINEERING. C, BIOMIMETIC MATERIALS, SENSORS AND SYSTEMS
Autore/i: E., Majkova; S., Luby; M., Jergel; A., Anopchenko; Y., Chushkin; Barucca, Gianni; A., DI CRISTOFORO; Mengucci, Paolo; E., D'Anna; A., Luches; M., Martino; HSIN YI, Lee
Classificazione: 1 Contributo su Rivista
Abstract: The interface reactions in (1 nm Fe/x nm W) and (2 nm Fe/x mn W) multilayers (x = 1, 2, 5 and 7) with 5 or 10 periods in as-deposited state and under KrF laser irradiation with fluences, F 0.05-0.25 J cm(-2) and 1 or 10 pulses were studied by X-ray diffraction (XRD), grazing incidence (GI) XRD, X-ray reflectivity, GI X-ray diffuse scattering and cross-section transmission electron microscopy (XTEM). Structurally coherent layers along the [110] direction with bcc symmetry were found in as-deposited and irradiated samples. This coherency is affected by the lateral waviness of the interfaces. The layered structure persists up to F 0.25 J cm(-2) and 10 pulses. Under the laser treatment, both the interface roughness and mixing increase with increasing deposited energy and promoted bcc W grain growth is observed.
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/51475 Collegamento a IRIS

2002
Excimer laser induced intermixing in irradiated Co/Ag nanometric bilayers and trilayers
MATERIALS SCIENCE AND ENGINEERING. C, BIOMIMETIC MATERIALS, SENSORS AND SYSTEMS
Autore/i: S., Luby; E., Majkova; M., Jergel; R., Senderak; A., Anopchenko; E., D'Anna; G., Leggieri; A., Luches; M., Martino; Mengucci, Paolo; G., Majni; A., DI CRISTOFORO
Editore: Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33259 Collegamento a IRIS

2001
Chitosan-oxychitin coatings for prosthetic materials
CARBOHYDRATE POLYMERS
Autore/i: Muzzarelli, Raa; Biagini, G; DE BENEDITTIS, A; Mengucci, Paolo; Majni, Giuseppe; Tosi, Giorgio
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/52434 Collegamento a IRIS

2001
Monoclinic carbon nitride phase coherently grown on Si(001) substrates
JOURNAL OF APPLIED PHYSICS
Autore/i: Barucca, Gianni; Majni, Giuseppe; Mengucci, Paolo; Leggieri, G.; Martino, M.
Classificazione: 1 Contributo su Rivista
Abstract: Carbon nitride films deposited on Si (001 ) substrates at room temperature by XeCl laser ablation of graphite targets in low pressure (1, 5, 10 and 50 Pa) N2 atmosphere at fluence of 12 J/cm2 (∼0.4 GW/cm2) have been investigated by x-ray diffraction and transmission electron microscopy in order to study the structure of the films. The results showed that the samples are constituted of a continuous amorphous film inside which microcrystals of a coherently grown CNx phase are dispersed. This phase is monoclinic with the following lattice parameters: a=b=0.384 nm, c =0.302 nm, α=y=90°, and β=96.5°. The CNx phase grows with the (001) plane coincident with the (001) plane of the Si substrate and with the [010]CNx direction parallel to the [110]Si one.
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/52429 Collegamento a IRIS

2001
A new monoclinic carbon nitride phase grows coherently on Si (001) substrates.
Proceedings of 5th Multinational Congress on Electron Microscopy.
Autore/i: Barucca, Gianni; G., Majni; Mengucci, Paolo; G., Leggieri; M., Martino
Editore: RINTON PRESS, INC, 565 EDMUND TERRACE, PRINCETON, NJ 07652 USA
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/49782 Collegamento a IRIS

2001
Fe/W multilayers irradiated by laser beams.
Proceedings of 5th Multinational Congress on Electron Microscopy.
Autore/i: Mengucci, Paolo; A., Dicristoforo; Barucca, Gianni; E., Majkova; S., Luby; M., Martino; A., Luches
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/49784 Collegamento a IRIS

2001
EARLY AGEING MECHANISMS IN A HIGH COPPER AlCuMg ALLOY
SCRIPTA MATERIALIA
Autore/i: Abis, S.; Massazza, M; Mengucci, Paolo; Riontino, G.
Editore: Elsevier Science Limited:Oxford Fulfillment Center, PO Box 800, Kidlington Oxford OX5 1DX United Kingdom:011 44 1865 843000, 011 44 1865 843699, EMAIL: asianfo@elsevier.com, tcb@elsevier.co.UK, INTERNET: http://www.elsevier.com, http://www.elsevier.com/locate/shpsa/, Fax: 011 44 1865 843010
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/32984 Collegamento a IRIS

2001
Early ageing mechanisms in a high copper AlCuMg alloy
5th Multinational Congress on Electron Microscopy
Autore/i: Mengucci, Paolo; DI CRISTOFORO, Adriano; Riontino, G.; Massazza, M.; Abis, S.
Editore: L. Dini, M Catalano
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/239118 Collegamento a IRIS

2000
Coherent growth of a CNx phase on Si (100) substrates.
Atti del Congresso Nazionale di Fisica della Materia.
Autore/i: Barucca, Gianni; Majni, G; Mengucci, Paolo; Leggieri, G; Luches, A; Martino, M.
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/49210 Collegamento a IRIS

2000
CHARACTERISATION OF TiAlN FILMS DEPOSITED BY REACTIVE PULSED LASER ABLATION
THIN SOLID FILMS
Autore/i: Acquaviva, S.; D'Anna, E.; Elia, L.; Fernandez, M.; Leggieri, G.; Luches, A.; Martino, M.; Mengucci, Paolo; Zocco, A.
Editore: Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33883 Collegamento a IRIS

2000
Crystalline carbon nitride films coherently grown on Si(100) substrates by reactive pulsed laser ablation.
Conference on Lasers and Electro-Optics Europe - Technical Digest
Autore/i: Barucca, Gianni; Elia, L; Fernandez, M; Luches, A; Majni, G; Martino, M; Mengucci, Paolo
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/49209 Collegamento a IRIS

2000
Characterisation of ferroelectric thin films by X-ray diffraction and electron microscopy
INTERNATIONAL JOURNAL OF INORGANIC MATERIALS
Autore/i: A., DE BENEDITTIS; A., DI CRISTOFORO; Majni, Giuseppe; Mengucci, Paolo
Editore: Elsevier
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33515 Collegamento a IRIS

2000
Carbon nitride coherently grown on Si (111) substrates by pulsed laser irradiation.
Proceedings of SPIE - The International Society for Optical Engineering.
Autore/i: Barucca, Gianni; Majni, Giuseppe; Mengucci, Paolo; Leggieri, G; Luches, A; Martino, M; Perrone, A.
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/49835 Collegamento a IRIS

2000
DSC investigation of natural ageing in high-copper AlCuMg alloys
Materials science forum
Autore/i: G., Riontino; S., Abis; Mengucci, Paolo
Editore: Trans Tech Publications Limited:Brandrain 6, CH 8037 Uetikon Switzerland:011 41 1 9221022, EMAIL: ttp@ttp.net, INTERNET: http://www.ttp.net, Fax: 011 41 1 9221033
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33265 Collegamento a IRIS

2000
Parametric studies of carbon nitride thin films deposited by reactive pulsed laser ablation.
Proceedings of SPIE - The International Society for Optical Engineering
Autore/i: Acquaviva, S; D'Anna, E; DE GIORGI, M. L.; Leggieri, G; Luches, A; Martino, M; Perrone, A; Zocco, A; Barucca, Gianni; Mengucci, Paolo
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/49836 Collegamento a IRIS

1999
A new carbon nitride phase coherently grown on Si(111).
Atti del Congresso Nazionale di Fisica della Materia.
Autore/i: Acquaviva, S; Barucca, Gianni; Leggieri, G; Luches, A; Majni, G; Martino, M; Mengucci, Paolo; Perrone, A.
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/49212 Collegamento a IRIS

1999
Effects of cobalt thin films on the a-Si crystallisation induced by excimer laser irradiation.
APPLIED SURFACE SCIENCE
Autore/i: Mengucci, Paolo; Barucca, Gianni; D'Anna, E.; Jergel, M.; Luby, S.; Majkova, E.; Martino, M.
Classificazione: 1 Contributo su Rivista
Abstract: In the present work, we report the results obtained by laser irradiation of a-Si/Co/SiO(2) and a-Si/SiO(2) samples in order to study the influence of the Co film on the a-Si crystallisation process. Both Co and a-Si layers were deposited by electron beam evaporation. Cobalt films of 0.5, 1 and 3 nm were deposited upon a 300 nm thick SiO(2) layer. The thickness of the a-Si layer was fixed at 200 nm. Samples were irradiated by a XeCl excimer laser under fluences of 0.40, 0.45 and 0.50 J cm(-2) and 1 or 10 number of pulses. Grazing incidence XRD and cross-sectional TEM were used for sample characterisation. Results showed the formation of CoSi(2) that, in general, considerably improves the crystallinity of the a-Si layer. In some cases, the presence of the CoSi(2) underlayer allowed the complete crystallisation of the a-Si layer even after the first laser pulse. Without CoSi(2), the same results were obtained only with a higher number of pulses.
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/51009 Collegamento a IRIS

1999
New carbon nitride phase coherently grown on Si (111)
JOURNAL OF APPLIED PHYSICS
Autore/i: Barucca, Gianni; Majni, Giuseppe; Mengucci, Paolo; Leggieri, G.; Luches, A.; Martino, M.; Perrone, A.
Classificazione: 1 Contributo su Rivista
Abstract: Carbon nitride films, deposited on Si(111) substrates at room temperature by XeCl laser ablation of graphite targets in low pressure (1, 5, 10, and 50 Pa) N2 atmosphere at the fluence of 12 J/cm2 (∼0.4 GW/cm2), have been submitted to accurate x-ray diffraction and transmission electron microscopy investigations in order to study the structure of the films. Results showed that the samples are constituted of a continuous amorphous film inside which microcrystals of a new coherently grown CNx phase are dispersed. This new phase has a triclinic crystallographic cell with lattice parameters a=b=0.384 nm, c=0.438±0.007 nm, α=110±1°, β=105±1°, and γ=120°. It coherently grows on the (111) Si plane with the following orientation relationships: (001)CNx ∥(111)Si, [100]CN ∥[1-10)]Si, and [010]CNx ∥[01-1)]Si.
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/52114 Collegamento a IRIS

1999
Intermixing in immiscible Co/Ag/Co trilayers under XeCl laser annealing
THIN SOLID FILMS
Autore/i: E., D'Anna; G., Leggieri; A., Luches; M., Martino; Majni, Giuseppe; Barucca, Gianni; Mengucci, Paolo; S., Luby; E., Majkova; M., Jergel
Classificazione: 1 Contributo su Rivista
Abstract: Co/Ag/Co trilayers were studied in order to confirm our previous results on the laser irradiation improvement of GMR ratio in immiscible Ag/Co multilayers (MLs). E-beam deposited samples were processed by XeCl excimer laser at the fluences F = 0.15, 0.2, 0.3 and 0.36 J/cm(2) with n = 1-100 pulses of 30 ns duration. The temperature versus time evolutions were computed for the first laser pulse. Samples were studied by grazing incidence XRD, RES and resistometry. From results it follows that grain boundary diffusion of Ag across Co layers going through even during short irradiation times, may be the explanation of GMR improvement via transformation of continuous ML into discontinuous one.
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/51545 Collegamento a IRIS

1999
A carbon nitride phase coherently grown on Si(111).
Proceedings of IV Multinational Congress on Electron Microscopy.
Autore/i: Barucca, Gianni; Mengucci, Paolo; G., Leggieri; M., Martino
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/49211 Collegamento a IRIS

1999
Osteoblast behaviour in the presence of bisphosphonates: Ultrastructural and biochemical in vitro studies
CLINICAL AND EXPERIMENTAL RHEUMATOLOGY
Autore/i: Gandolfi, M. G.; Pugnaloni, Armanda; MATTIOLI BELMONTE CIMA, Monica; Muzzarelli, R.; DE BENEDITTIS, A.; Mengucci, Paolo; Zucchini, C.; Tesei, M.; Caudarella, R.; Biagini, Graziella
Editore: Clinical and Experimental Rheumatology:Via S Maria 31, I 56126 Pisa Italy:011 39 050 40124, EMAIL: info@clinexprhematol.org, INTERNET: http://www.clinexprhematol.org, Fax: 011 39 050 502299
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/32965 Collegamento a IRIS

1999
Amorphous silicon crystallisation induced by CoSi2 interlayers under XeCl excimer laser irradiation.
Proceedings of IV Multinational Congress on Electron Microscopy
Autore/i: Mengucci, Paolo; Barucca, Gianni; S., Luby; A., Luches
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/49208 Collegamento a IRIS

1999
Thermal behaviour of Co/Si/W/Si multilayers under high intensity excimer laser pulses
APPLIED SURFACE SCIENCE
Autore/i: E., Majkova; S., Luby; A., Anopchenko; M., Jergel; A., Luches; M., Martino; Mengucci, Paolo; G., Majni
Editore: Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33293 Collegamento a IRIS

1998
Bioactivity modulation of bioactive materials in view of their application in osteoporotc patients
JOURNAL OF MATERIALS SCIENCE. MATERIALS IN MEDICINE
Autore/i: MATTIOLI BELMONTE CIMA, Monica; A., De Bennedittis; Gandolfi, M. G.; Raa, Muzzarelli; A., Krajewski; Mengucci, Paolo; M., Fini; C., Zucchini; A., Ravaglioli; E., Roncari; R., Giardino; G., Biagini
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/64688 Collegamento a IRIS

1998
BIOACTIVITY MODULATION OF BIOACTIVE MATERIALS IN VIEW OF THEIR APPLICATION IN OSTEOPOROTIC PATIENTS
JOURNAL OF MATERIALS SCIENCE
Autore/i: MATTIOLI BELMONTE CIMA, Monica; DE BENEDITTIS, A; Muzzarelli, R. A. A.; Mengucci, Paolo; Biagini, Graziella; Krajewski, A; Ravaglioli, A; Roncari, E; Fini, M; Giardino, R.
Editore: Kluwer Academic Publishers:Journals Department, PO Box 322, 3300 AH Dordrecht Netherlands:011 31 78 6576050, EMAIL: frontoffice@wkap.nl, kluweronline@wkap.nl, INTERNET: http://www.kluwerlaw.com, Fax: 011 31 78 6576254
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/34715 Collegamento a IRIS

1998
STUDY OF THE INTERFACE REACTIONS BETWEEN CELLS AND A BIOCOMPATIBLE CERAMIC
BIOMATERIALS
Autore/i: Mengucci, Paolo; Majni, G.; DE BENEDITTIS, A.; Biagini, G.; MATTIOLI BELMONTE CIMA, Monica
Editore: Elsevier Science Limited:Oxford Fulfillment Center, PO Box 800, Kidlington Oxford OX5 1DX United Kingdom:011 44 1865 843000, 011 44 1865 843699, EMAIL: asianfo@elsevier.com, tcb@elsevier.co.UK, INTERNET: http://www.elsevier.com, http://www.elsevier.com/locate/shpsa/, Fax: 011 44 1865 843010
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33178 Collegamento a IRIS

1998
Carbon nitride films deposited by high-fluence laser ablation.
VUOTO
Autore/i: S., Acquaviva; E., Danna; M. L., DE GIORGI; G., Leggieri; A., Luches; M., Martino; A., Perrone; A., Zocco; Barucca, Gianni; Mengucci, Paolo
Editore: Patron Editore:Via Badini 12, I 40050 Quarto Inferiore Bologna Italy:011 39 051 767003, EMAIL: abbonamenti@patroneditore.com, info@patroneditore.com, INTERNET: http://www.patroneditore.com, Fax: 011 39 051 768252
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/40820 Collegamento a IRIS

1998
Crystallisation of perovskite PZT films on MgO substrates
THIN SOLID FILMS
Autore/i: Barucca, Gianni; DE BENEDITTIS, A.; DI CRISTOFORO, A.; Majni, Giuseppe; Mengucci, Paolo; Leccabue, F.; Watts, B. E.
Classificazione: 1 Contributo su Rivista
Abstract: Lead zirconate titanate (PZT) films deposited by sol-gel on MgO substrates have been studied by glancing angle X-ray diffraction (GAD) and scanning (SEM) and transmission (TEM) electron microscopy. To study the possibility of growing preferentially oriented films, two different compositions were considered: Pb(Zr0.52Ti0.48)O3 and Pb(Zr0.2Ti0.8)O3. Preliminary results suggest that a preferential orientation occurs depending on the film composition. In particular, a higher Ti content seems to favour the orientation along the [001] direction.
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/52258 Collegamento a IRIS

1998
Reactive Laser Ablation Deposition of Carbon Nitride Thin Films.
VUOTO
Autore/i: G., Leggieri; A., Luches; M., Martino; A., Perrone; Barucca, Gianni; Mengucci, Paolo
Editore: Patron Editore:Via Badini 12, I 40050 Quarto Inferiore Bologna Italy:011 39 051 767003, EMAIL: abbonamenti@patroneditore.com, info@patroneditore.com, INTERNET: http://www.patroneditore.com, Fax: 011 39 051 768252
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/40824 Collegamento a IRIS

1998
Study of carbon nitride synthesis and deposition by reactive laser ablatio of graphite in low-pressure nitrogen atmosphere
LASER PHYSICS
Autore/i: M. L., DE GIORGI; G., Leggieri; A., Luches; A., Perrone; A., Zocco; J., Zemek; M., Trchova; Barucca, Gianni; Mengucci, Paolo
Classificazione: 1 Contributo su Rivista
Abstract: Carbon nitride films were deposited on 〈111〉 Si substrates by XeCl laser ablation of graphite in low-pressure (1-50 Pa) N2 atmosphere at fluences of 12 and 16 J/cm2. Substrates were usually at room temperature. Some films were deposited on heated (250 or 500°C) substrates. Different diagnostic techniques (SEM, TEM, RBS, XPS, FTIR, XRD) were used to characterize the deposited films. Films resulted plane and well adherent to their substrates. N/C atomic ratios up to 0.7 were inferred from RBS measurements. Nitrogen content increases with increasing ambient pressure and laser fluence. XPS spectra of the N 1s peak indicate two different bonding states of nitrogen atoms, bound to sp2-coordinated C atoms and to sp3-coordinated C atoms. XRD and TEM analyses point to an oriented microcrystalline structure of the films. Heating of the substrates results in a lower nitrogen concentration with respect to films deposited at room temperature in otherwise identical experimental conditions. Optical emission studies of the laser plasma plume indicate a positive correlation between the emission intensity of the CN radicals in the plume and the nitrogen atom concentration in the films.
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/53246 Collegamento a IRIS

1998
Cobalt disilicide induced crystallisation of amorphous silicon under XeCl excimer laser irradiation
LASER PHYSICS
Autore/i: S., Luby; E., Majkova; M., Jergel; E., D'Anna; A., Luches; M., Martino; Mengucci, Paolo; G., Majni; E., Dobrocka
Editore: Maik Nauka / Interperiodica:Profsoyuznaya 90, Moscow 117864 Russia:011 7 095 3360266, Fax: 011 7 095 3360666
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33292 Collegamento a IRIS

1997
An experimental study in X-ray spectroscopy of the zirconium (Ca-PSZ)-bone interface; microanalytical evaluation of the osteogenetic response
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
Autore/i: MATTIOLI BELMONTE CIMA, Monica; Mengucci, Paolo; Specchia, Nicola; G., Gobbi; S., Dubini; L., Simonelli; F., Greco; G., Majni; G., Biagini; C., Rizzoli
Editore: Kluwer Academic Publishers:Journals Department, PO Box 322, 3300 AH Dordrecht Netherlands:011 31 78 6576050, EMAIL: frontoffice@wkap.nl, kluweronline@wkap.nl, INTERNET: http://www.kluwerlaw.com, Fax: 011 31 78 6576254
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33287 Collegamento a IRIS

1997
An experimental study in x-ray spectroscopy of the zirconium oxide (Ca-PSZ)- bone interface. Micronalitic evaluation of the osteogenetic response.
JOURNAL OF MATERIALS SCIENCE. MATERIALS IN MEDICINE
Autore/i: MATTIOLI BELMONTE CIMA, Monica; Mengucci, Paolo; Specchia, Nicola; G., Gobbi; L., Simonelli; Greco, Francesco; Majni, Giuseppe; G., Biagini:
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/64733 Collegamento a IRIS

1997
The crystallisation behaviour of Pb(Zr,Ti)O3 sol gel films on platinum electrodes
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
Autore/i: A., DI CRISTOFORO; Mengucci, Paolo; G., Majni; F., Leccabue; B. E., Watts; G., Chiorboli
Editore: Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33291 Collegamento a IRIS

1997
Preparation of Pb(Ti,Zr)O3/RuO2 multilayers in situ by pulsed laser ablation deposition
INTEGRATED FERROELECTRICS
Autore/i: A., Iembo; F., Fuso; M., Allegrini; E., Arimondo; A., DE BENEDITTIS; A., DI CRISTOFORO; Mengucci, Paolo; B. E., Watts; F., Leccabue
Editore: Taylor & Francis Limited:Rankine Road, Basingstoke RG24 8PR United Kingdom:011 44 1256 813035, EMAIL: madeline.sims@tandf.co.uk, info@tandf.co.uk, INTERNET: http://www.tandf.co.uk, Fax: 011 44 1256 330245
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33289 Collegamento a IRIS

1997
Characterization of C-N thin films deposited by reactive excimer laser ablation of graphite targets in nitrogen atmosphere
THIN SOLID FILMS
Autore/i: Caricato, A. P.; Leggieri, G.; Luches, A.; Perrone, A.; Gyorgy, E.; Mihailescu, I. N.; Popescu, M.; Barucca, Gianni; Mengucci, Paolo; Zemek, J.; Trchova, M.
Classificazione: 1 Contributo su Rivista
Abstract: Carbon nitride films were deposited at room temperature on 〈111〉 Si substrates by XeCl laser ablation of graphite in low pressure (1-50 Pa) N2 atmosphere at a fluence of 12 J/cm2. N/C atomic ratios up to 0.5 were inferred from Rutherford backscattering measurements. Different diagnostic techniques (ARXPS, FTIR transmission spectroscopy, EDS, SEM and XRD) were used to characterize the deposited films. XRD spectra indicate a polycrystalline structure of the films. © 1997 Elsevier Science S.A.
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/50252 Collegamento a IRIS

1997
Lead zirconate titanate deposited on RuO2 by pulsed laser ablation
APPLIED SURFACE SCIENCE
Autore/i: A., DE BENEDITTIS; A., DI CRISTOFORO; Majni, Giuseppe; Mengucci, Paolo; B. E., Watts; F., Leccabue; E., Vasco; A., Diodati
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/72058 Collegamento a IRIS

1997
Parametric study of C-N films deposited by reactive laser ablation.
SPIE- Proceedings
Autore/i: A., Luches; A. P., Caricato; E., Danna; G., Leggieri; M., Martino; A., Perrone; Barucca, Gianni; G., Majni; Mengucci, Paolo; R., Alexandrescu; I. N., Mihailescu; J., Zemek
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/49788 Collegamento a IRIS

1997
An experimental study in X-ray spectroscopy of the zirconium (Ca-PSZ) - bone interface. Microanalytic evaluation of the osteogenetic response
JOURNAL OF MATERIALS SCIENCE. MATERIALS IN MEDICINE
Autore/i: MATTIOLI BELMONTE CIMA, Monica; Mengucci, Paolo; Specchia, Nicola; Gobbi, G; Dubini, S; Simonelli, L; Greco, Francesco; Majni, Giuseppe; Biagini, G; Rizzoli, C.
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/53381 Collegamento a IRIS

1996
Laser reactive ablation deposition of silicon carbide films
APPLIED SURFACE SCIENCE
Autore/i: G., Leggieri; A., Luches; M., Martino; A., Perrone; R., Alexandrescu; A., Barborica; E., Gyorgy; I. N., Mihailescu; G., Majni; Mengucci, Paolo
Editore: Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33286 Collegamento a IRIS

1996
A STUDY OF AGEING IN AN Al-Cu-Mg-Zn FOUNDRY ALLOY
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
Autore/i: Abis, S.; Mengucci, Paolo; Riontino, G.
Editore: Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/32985 Collegamento a IRIS

1996
Growth of Si1-xGex alloys by MBE
Materials science forum
Autore/i: N., Pinto; R., Murri; L., Trojani; G., Majni; Mengucci, Paolo; Lucchetti, Liana
Editore: Trans Tech Publications Limited:Brandrain 6, CH 8037 Uetikon Switzerland:011 41 1 9221022, EMAIL: ttp@ttp.net, INTERNET: http://www.ttp.net, Fax: 011 41 1 9221033
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33856 Collegamento a IRIS

1996
Laser reactive ablation deposition of carbon nitride thin films.
SPIE-Proceedings
Autore/i: A., Luches; A. P., Caricato; E., Danna; G., Leggieri; M., Martino; A., Perrone; Barucca, Gianni; Mengucci, Paolo; J., Zemek
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/49789 Collegamento a IRIS

1996
Stability of interfaces in Mo/Cu multilayered metallization
THIN SOLID FILMS
Autore/i: S., Luby; E., Majkova; M., Jergel; M., Brunel; G., Leggieri; A., Luches; Majni, Giuseppe; Mengucci, Paolo
Editore: Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33229 Collegamento a IRIS

1996
Effect of composition and preparation conditions on the microstructure of lead zirconate titanate films
JOURNAL OF CRYSTAL GROWTH
Autore/i: A., DI CRISTOFORO; Mengucci, Paolo; Majni, Giuseppe; M., Severi; S., Guerri; B. E., Watts; F., Leccabue; D., Seuret
Editore: Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33285 Collegamento a IRIS

1996
Strain relaxation through islands formation in epitaxial SiGe thin films
APPLIED SURFACE SCIENCE
Autore/i: Barucca, Gianni; Lucchetti, Liana; Majni, Giuseppe; Mengucci, Paolo; R., Murri; N., Pinto
Classificazione: 1 Contributo su Rivista
Abstract: The mechanisms of strain relaxation and island formation have been investigated by transmission electron microscopy techniques in highly strained Si-Ge thin films. Furthermore the distribution of the strain field inside the substrate in proximity of the interface has been studied and qualitative information has been drawn. Results have shown that the substrate takes part to the relaxation process and that the strain field is mainly concentrated underneath islands with the higher values of the strain gradient located near the edges of each island.
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/52107 Collegamento a IRIS

1996
Elastic deformation in epitaxial Si1-XGeX alloys grown in three-dimensional mode on Si(001).
Proceedings of 11th European Congress on Microscopy (EUREM96).
Autore/i: Barucca, Gianni; Lucchetti, Liana; G., Majni; Mengucci, Paolo
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/53821 Collegamento a IRIS

1995
Microstructural characterization of titanium carbide films deposited by laser reactive ablation.
Atti del XX Congresso di Microscopia Elettronica.
Autore/i: Barucca, Gianni; G., Majni; Mengucci, Paolo; G., Leggieri
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/49213 Collegamento a IRIS

1995
Effects of strain in highly strained Si-Ge thin films
Atti del XX Congresso di Microscopia Elettronica
Autore/i: Lucchetti, Liana; G., Majni; Mengucci, Paolo; N., Pinto
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/45969 Collegamento a IRIS

1995
Correlations between microstructure and a.c. magnetic response of bulk superconducting YBa2Cu3O7-x
NUOVO CIMENTO DELLA SOCIETÀ ITALIANA DI FISICA. D CONDENSED MATTER, ATOMIC, MOLECULAR AND CHEMICAL PHYSICS, BIOPHYSICS
Autore/i: Rinaldi, Daniele; I., Pop; R., Caciuffo; G., Cone; Francescangeli, Oriano; Mengucci, Paolo; A., Stepanescu; I., Stirbat
Editore: Societa Italiana di Fisica:Via Saragozza 12 Subs Service, I 40123 Bologna Italy:011 39 051 331554, EMAIL: sif@sif.it, INTERNET: http://www.sif.it, Fax: 011 39 051 581340
Classificazione: 1 Contributo su Rivista
Abstract: The magnetic response of granular superconducting YBCO samples with different grain sizes is reported. The analysis is carried out by measuring the low-frequency a.c. magnetic susceptibility as a function of the temperature with an applied magnetic field of amplitude ranging between 0.4 and 800 A/m. The observed magnetic behaviour is interpreted in terms of grain size and weak-links properties. The experimental results evidence the influence of the sample microstructure on the magnetic susceptibility. The intergranular and intragranular onset temperatures are compared with the critical temperature of the samples obtained by means of electrical-resistivity measurements. The temperature dependence of the intergranular critical current density is derived from the susceptibility data.
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33263 Collegamento a IRIS

1995
Precipitation sequence in an Al-Cu-Mg-Ag-Zn alloy
PHILOSOPHICAL MAGAZINE. A. PHYSICS OF CONDENSED MATTER. STRUCTURE, DEFECTS AND MECHANICAL PROPERTIES
Autore/i: G., Riontino; Mengucci, Paolo; S., Abis
Editore: Taylor & Francis
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/32983 Collegamento a IRIS

1995
Laser reactive ablation deposition of TiC films
VACUUM
Autore/i: G., Leggieri; A., Luches; A., Perrone; G., Majni; Mengucci, Paolo
Editore: Oxford: Elsevier Science Limited http://www.elsevier.com
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33226 Collegamento a IRIS

1995
Microstructural characterisation of thin films obtained by laser irradiation
MICROSCOPY MICROANALYSIS MICROSTRUCTURES
Autore/i: Mengucci, Paolo; Barucca, Gianni; R., Marzocchini; G., Leggieri
Classificazione: 1 Contributo su Rivista
Abstract: Thin films obtained by direct pulsed excimer laser irradiation and by laser reactive ablation were characterized by scanning electron microscopy, cross sectional transmission electron microscopy and grazing angle X-ray diffraction. The results obtained were interpreted in function of the deposition parameters such as substrate temperature, pressure of the ambient atmosphere, number of laser pulses and laser fluence.
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/52014 Collegamento a IRIS

1995
Correlations between Microstructure and a.c. Magnetic Response of Bulk Superconducting YBa2Cu3O7-x
NUOVO CIMENTO DELLA SOCIETÀ ITALIANA DI FISICA. D CONDENSED MATTER, ATOMIC, MOLECULAR AND CHEMICAL PHYSICS, BIOPHYSICS
Autore/i: Rinaldi, Daniele; I., Pop; Caciuffo, ROBERTO GIOVANNI MARIA; G., Cone; Francescangeli, Oriano; Mengucci, Paolo; A., Stepanescu; I., Stirbat
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/51093 Collegamento a IRIS

1995
Laser reactive ablation deposition of titanium carbide films
THIN SOLID FILMS
Autore/i: G., Leggieri; A., Luches; M., Martino; A., Perrone; G., Majni; Mengucci, Paolo; I. N., Mihailescu
Editore: Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33225 Collegamento a IRIS

1995
Islands formation conditions in silicon-germanium alloys grown by MBE
JOURNAL OF CRYSTAL GROWTH
Autore/i: R. MURRI N., Pinto; L., Trojani; Lucchetti, Liana; Majni, Giuseppe; Mengucci, Paolo
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/51284 Collegamento a IRIS

1995
Excimer laser reactive ablation deposition of silicon nitride films
APPLIED SURFACE SCIENCE
Autore/i: E., D'Anna; G., Leggieri; A., Luches; M., Martino; A., Perrone; G., Majni; Mengucci, Paolo; R., Alexandrescu; I. N., Mihailescu; J., Zemek
Editore: Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33025 Collegamento a IRIS

1995
Laser reactive ablation deposition of silicon nitride films
APPLIED PHYSICS. A, MATERIALS SCIENCE & PROCESSING
Autore/i: M. L., DE GIORGI; G., Leggieri; A., Luches; M., Martino; A., Perrone; Majni, Giuseppe; Mengucci, Paolo
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/51246 Collegamento a IRIS

1995
Islands formation in Si1-xGex thin films deposited by MBE
VUOTO
Autore/i: Lucchetti, Liana; G., Majni; Mengucci, Paolo; R., Murri; N., Pinto; L., Troiani
Editore: Patron Editore:Via Badini 12, I 40050 Quarto Inferiore Bologna Italy:011 39 051 767003, EMAIL: abbonamenti@patroneditore.com, info@patroneditore.com, INTERNET: http://www.patroneditore.com, Fax: 011 39 051 768252
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/34221 Collegamento a IRIS

1994
Electron microscopy characterisation of AlSn metal-metal matrix composites
JOURNAL OF ALLOYS AND COMPOUNDS
Autore/i: S., Abis; Barucca, Gianni; Mengucci, Paolo
Classificazione: 1 Contributo su Rivista
Abstract: An electron microscopy characterization of three antifriction materials based on the AlSn system was carried out. AlSn20Cul, AlSn15Si3Cu1 and AlSn15Si3Cu1Mn0.5 both in the as-cast and in the rolled and annealed condition were considered in order to investigate the microstructure and the influence of addition of minor elements. Results show that the microstructure is characterized by the presence of Snrich islands containing the intermetallic Al3Cu12Sn phase. Addition of Si causes the formation of small Si particles both associated with the Sn-based islands and isolated in the matrix. Mn addition induces an increase in the tensile properties of the material via a work-hardening mechanism.
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/51214 Collegamento a IRIS

1994
Laser reactive ablation of thin nitride films
JOURNAL DE PHYSIQUE II
Autore/i: E., D'Anna; M. L., DE GIORGI; G., Leggieri; A., Luches; G., Majni; M., Martino; I. N., Mihailescu; Mengucci, Paolo
Editore: EDP Sciences:17 Ave Du Hoggar, BP112, 91944 Les Ulis Cedex A France:011 33 1 69187575, EMAIL: subscribers@edpsciences.com, INTERNET: http://www.edpsciences.com, Fax: 011 33 1 69860678
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/32742 Collegamento a IRIS

1994
Laser reactive ablation deposition of nitride films
APPLIED SURFACE SCIENCE
Autore/i: A., Luches; G., Leggieri; M., Martino; A., Perrone; G., Majni; Mengucci, Paolo; I. N., Mihailescu
Editore: Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/33023 Collegamento a IRIS

1994
Laser reactive ablation deposition of titanium nitride and titanium carbide films
Laser Materials Processing and Machining
Autore/i: D'Anna, E.; Leggieri, G.; Luches, A.; Martino, M.; Perrone, A.; Majni, Giuseppe; Mengucci, Paolo; Mihailescu, I. N.
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/239099 Collegamento a IRIS

1994
A TEM study of the influence of Si on the precipitation processes of an Al-Cu-Mg-Ag alloy
Electron Microscopy '94
Autore/i: Abis, S.; Mengucci, Paolo; Riontino, G.
Editore: B. Jouffrey, C. Colliex
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/239102 Collegamento a IRIS

1994
Titanium Carbide Films Deposited by Laser Reactive Ablation.
Proceedings of the MRS Symposium.
Autore/i: Barucca, Gianni; G., Leggieri; A., Luches; G., Majni; Mengucci, Paolo
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/49214 Collegamento a IRIS

1994
Simultaneous formation of titanium nitride and titanium silicide in a one-step process in heterogeneous phase during multipulse laser treatment of a Si wafer with a thin Ti coating in superatmospheric N2
THIN SOLID FILMS
Autore/i: I. N., Mihailescu; N., Chitica; A., Lita; V. S., Teodorescu; A., Luche; G., Leggieri; M., Martino; G., Majni; Mengucci, Paolo
Editore: Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/32743 Collegamento a IRIS

1994
Iron silicide formation by excimer laser pulses
Laser-Assisted Fabrication of Thin Films and Microstructures
Autore/i: Luches, A.; D'Anna, E.; Leggieri, G.; Luby, S.; Majkova, E.; Majni, Giuseppe; Mengucci, Paolo
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/239096 Collegamento a IRIS

1994
Influence of Si additions on the ageing process of an Al-Cu-Mg-Ag alloy
PHILOSOPHICAL MAGAZINE. A. PHYSICS OF CONDENSED MATTER. DEFECTS AND MECHANICAL PROPERTIES
Autore/i: S., Abis; Mengucci, Paolo; G., Riontino
Editore: Taylor & Francis Limited:Rankine Road, Basingstoke RG24 8PR United Kingdom:011 44 1256 813035, EMAIL: madeline.sims@tandf.co.uk, info@tandf.co.uk, INTERNET: http://www.tandf.co.uk, Fax: 011 44 1256 330245
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/32744 Collegamento a IRIS




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