211 pubblicazioni classificate nel seguente modo:

Parametric study of C-N films deposited by reactive laser ablation.
SPIE- Proceedings
Autore/i: A., Luches; A. P., Caricato; E., Danna; G., Leggieri; M., Martino; A., Perrone; Barucca, Gianni; G., Majni; Mengucci, Paolo; R., Alexandrescu; I. N., Mihailescu; J., Zemek
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/49788

Characterization of C-N thin films deposited by reactive excimer laser ablation of graphite targets in nitrogen atmosphere
THIN SOLID FILMS
Autore/i: Caricato, A. P.; Leggieri, G.; Luches, A.; Perrone, A.; Gyorgy, E.; Mihailescu, I. N.; Popescu, M.; Barucca, Gianni; Mengucci, Paolo; Zemek, J.; Trchova, M.
Classificazione: 1 Contributo su Rivista
Abstract: Carbon nitride films were deposited at room temperature on 〈111〉 Si substrates by XeCl laser ablation of graphite in low pressure (1-50 Pa) N2 atmosphere at a fluence of 12 J/cm2. N/C atomic ratios up to 0.5 were inferred from Rutherford backscattering measurements. Different diagnostic techniques (ARXPS, FTIR transmission spectroscopy, EDS, SEM and XRD) were used to characterize the deposited films. XRD spectra indicate a polycrystalline structure of the films. © 1997 Elsevier Science S.A.
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/50252

Elastic deformation in epitaxial Si1-XGeX alloys grown in three-dimensional mode on Si(001).
Proceedings of 11th European Congress on Microscopy (EUREM96).
Autore/i: Barucca, Gianni; Lucchetti, Liana; G., Majni; Mengucci, Paolo
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/53821

Strain relaxation through islands formation in epitaxial SiGe thin films
APPLIED SURFACE SCIENCE
Autore/i: Barucca, Gianni; Lucchetti, Liana; Majni, Giuseppe; Mengucci, Paolo; R., Murri; N., Pinto
Classificazione: 1 Contributo su Rivista
Abstract: The mechanisms of strain relaxation and island formation have been investigated by transmission electron microscopy techniques in highly strained Si-Ge thin films. Furthermore the distribution of the strain field inside the substrate in proximity of the interface has been studied and qualitative information has been drawn. Results have shown that the substrate takes part to the relaxation process and that the strain field is mainly concentrated underneath islands with the higher values of the strain gradient located near the edges of each island.
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/52107

Laser reactive ablation deposition of carbon nitride thin films.
SPIE-Proceedings
Autore/i: A., Luches; A. P., Caricato; E., Danna; G., Leggieri; M., Martino; A., Perrone; Barucca, Gianni; Mengucci, Paolo; J., Zemek
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/49789

Microstructural characterization of titanium carbide films deposited by laser reactive ablation.
Atti del XX Congresso di Microscopia Elettronica.
Autore/i: Barucca, Gianni; G., Majni; Mengucci, Paolo; G., Leggieri
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/49213

Microstructural characterisation of thin films obtained by laser irradiation
MICROSCOPY MICROANALYSIS MICROSTRUCTURES
Autore/i: Mengucci, Paolo; Barucca, Gianni; R., Marzocchini; G., Leggieri
Classificazione: 1 Contributo su Rivista
Abstract: Thin films obtained by direct pulsed excimer laser irradiation and by laser reactive ablation were characterized by scanning electron microscopy, cross sectional transmission electron microscopy and grazing angle X-ray diffraction. The results obtained were interpreted in function of the deposition parameters such as substrate temperature, pressure of the ambient atmosphere, number of laser pulses and laser fluence.
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/52014

Titanium Carbide Films Deposited by Laser Reactive Ablation.
Proceedings of the MRS Symposium.
Autore/i: Barucca, Gianni; G., Leggieri; A., Luches; G., Majni; Mengucci, Paolo
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/49214

Electron microscopy characterisation of AlSn metal-metal matrix composites
JOURNAL OF ALLOYS AND COMPOUNDS
Autore/i: S., Abis; Barucca, Gianni; Mengucci, Paolo
Classificazione: 1 Contributo su Rivista
Abstract: An electron microscopy characterization of three antifriction materials based on the AlSn system was carried out. AlSn20Cul, AlSn15Si3Cu1 and AlSn15Si3Cu1Mn0.5 both in the as-cast and in the rolled and annealed condition were considered in order to investigate the microstructure and the influence of addition of minor elements. Results show that the microstructure is characterized by the presence of Snrich islands containing the intermetallic Al3Cu12Sn phase. Addition of Si causes the formation of small Si particles both associated with the Sn-based islands and isolated in the matrix. Mn addition induces an increase in the tensile properties of the material via a work-hardening mechanism.
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/51214

New Perspectives for the Edwards IBT 200 Ion Beam Thinner.
MICROSCOPIA ELETTRONICA
Autore/i: A., Bartolucci; Barucca, Gianni; Mengucci, Paolo
Editore: Bologna : [s.n.!.
Classificazione: 1 Contributo su Rivista
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/41111

Synthesis of Ti2N-TiSi2 Layers by One-Step Excimer Laser Irradiation.
Proceedings of the MRS Symposium.
Autore/i: G., Majni; Mengucci, Paolo; Barucca, Gianni; G., Leggieri; A., Luches
Classificazione: 4 Contributo in Atti di Convegno (Proceeding)
Scheda della pubblicazione: https://iris.univpm.it/handle/11566/49838